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Product Details

NewAge Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

NewAge Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Product Code: 9788184894295
Rs.499.00Rs.464.077%
NewAge Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
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  • Author
  • Sachdev, Manoj
  • Binding
  • Paperback
  • Board
  • Preparation/Entrance Exam Books
  • Book Code
  • 9788184894295
  • Class
  • Preparation/Entrance Exam Books
  • Manufacturer
  • New Age International Pub
  • Page No
  • 350
  • Print Year
  • 2010
  • Model ID
  • 9788184894295
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